Integrated Circuit Die Silicon Area & Routing Margins (Electrical & Computer Engineering) Solution
Formulas & Definitions
Problem Overview
An ASIC design team optimizes the layout of a semiconductor die containing an active logic core of 48 mm2 bounded by 2 mm side margins and 1.5 mm top/bottom margins. We formulate total silicon area A=W⋅H, reduce variables, and verify the global minimum using the Second Derivative Test.
Step-by-Step Mathematical Solution
Step 1: Formulate Overall Dimensions and Objective Function
Active core dimensions must be strictly positive: x>0.
Feasible physical domain is the open interval x∈(0,∞).
Step 4: Differentiate and Find Critical Numbers
Differentiate A(x) with respect to x using the Power Rule:
A′(x)=dxd[3x+192x−1+60]=3−x2192
Set A′(x)=0 to find stationary points:
3−x2192=0⟹3x2=192⟹x2=64
x=64=8 mm
(Reject x=−8 mm because physical length cannot be negative).
Step 5: Verify Global Minimum via Second Derivative Test
Compute the second derivative:
A′′(x)=dxd[3−192x−2]=x3384
Evaluate at the critical point x=8 mm:
A′′(8)=(8)3384=512384=43=0.75>0
Because A′′(8)>0 and x=8 mm is the unique critical point on (0,∞), the function is concave up everywhere in the feasible region, mathematically proving that x=8 mm yields the absolute minimum die area.
Step 6: Compute Final Core and Die Dimensions
Active Core Height (y):
y=848=6 mm
Overall Die Dimensions (W×H):
Total Width: W=8+4=12 mm
Total Height: H=6+3=9 mm
Minimum Total Silicon Die Area:
Amin=12×9=108 mm2
VLSI Engineering Insight: The active core aspect ratio is yx=68=34, while the overall die aspect ratio is HW=912=34. The optimal layout aligns the core aspect ratio precisely with the margin ratio ΔHΔW=34, ensuring balanced silicon utilization.